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P Chart (Proportion Nonconforming)Free online tool · works on PC and mobile
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P Control Chart: Nonconforming Proportion Online

What is a P Chart?

The P chart monitors the proportion of nonconforming units (nonconforming count divided by inspected count) and belongs to the attribute family of control charts. It models the process with the binomial distribution - each unit is judged conforming or not - and tracks the movement of the nonconforming proportion, suiting percentage-based quality management.

When to Use It

Use it when the data are attribute (go/no-go) and reported as a nonconforming rate, especially when sample sizes vary - for example when daily output differs or inspection counts change from lot to lot. When every batch is inspected at a fixed size, the NP chart (nonconforming count) is more intuitive.

P vs C and U Charts

The P chart tracks the proportion of nonconforming units (the fraction of defective products); the C chart tracks the number of defects on a fixed inspection unit; the U chart tracks the defect rate per unit when the unit size varies. P is about good/bad product while C/U count defects per product - different applications.

Control Limits

The center line is the average nonconforming proportion pbar; the limits are pbar +/- 3*sqrt(pbar*(1-pbar)/n), where n is the inspected quantity of each batch. Because n varies, the P chart limits form a stepped (sawtooth) band; the tool computes and plots the limits for each batch's actual sample size.

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Frequently Asked Questions
What if the P chart lower limit is negative?
When the average nonconforming rate or the sample size is very small, the lower limit computes as negative; by convention it is set to 0 (no lower limit), meaning no lower bound is imposed.
Must every batch have the same sample size?
No - the P chart's main advantage is allowing varying sample sizes; the tool recalculates the limits per batch. Only when the sample size is fixed is the NP chart recommended for simplicity.
Can I use a P chart for extremely low defect rates (ppm)?
With very low rates, many batches show zero defects and detection power drops; consider defect-count charts (C/U) or a dedicated analysis of zero-defect batches.