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🗺️ Wafer Map Yield Analysis
bin distribution → total yield + center/mid/edge zone yields and defect-pattern hints
Wafer Map data (one line per die: x y bin; bin=0 bad, non-zero good)
Notes
· Zones by radius from center: center (r<R/3), mid, edge (r>2R/3), with yield for each.
· Edge yield clearly lower → suggests edge defects / edge process issues; random overall → suggests random defects.
About Wafer Map Yield Analysis
Wafer map analysis: import per-die Bin test results, plot the wafer map, recognize spatial defect patterns and compare regional yields.
Learn more about this tool →
Wafer Yield Calculator
Cleanroom Classification (ISO 14644)
ESD Control Assessment
Statistical Process Control
Expected Failures & MTTF
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