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🔥 Arrhenius Acceleration Factor
Semiconductor reliability: HTOL/HAST/Burn-in acceleration factor and field-life conversion
Parameters
Notes
· AF = exp[(Ea/k)·(1/T_use − 1/T_test)], k = 8.617e-5 eV/K, temperatures in Kelvin.
· Used for stress acceleration in high-temperature accelerated life tests and converting test duration to equivalent field operating life.
About Arrhenius Acceleration Factor
Compute the Arrhenius acceleration factor AF and equivalent test time from activation energy, test and use temperatures for accelerated life testing.
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