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📈 Rayleigh Defect Prediction
Fit the defect-discovery trend with the Rayleigh model → predict total defects and residual defects at release
Project parameters (unify the time unit: testing weeks or months)
Model Notes (Putnam / Rayleigh)
· Cumulative defects N(t) = D_total × [1 − e^(−(t/c)²)]; the defect arrival rate peaks at t = c. Given the current point (t0, d0), back-solve the total: D_total = d0 / [1 − e^(−(t0/c)²)].
· Residual defects at release t_ok = D_total × e^(−(t_ok/c)²). The model is more reliable when discovered defects are already well past the peak point, or when c is small.
About Rayleigh Defect Prediction
Rayleigh defect prediction tool: fit a defect discovery rate curve, estimate total defects, peak discovery time and convergence time for release decisions.
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Time Series Forecasting
Weibull Analysis
Reliability Calculator
Accelerated Life Testing (ALT)
Expected Failures & MTTF
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